On-chip testing of very large scale integrated circuits

Bibliographic Details
Main Author: Varma, P.
Published: University of Manchester 1984
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.352018
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spelling ndltd-bl.uk-oai-ethos.bl.uk-3520182015-03-19T07:05:02ZOn-chip testing of very large scale integrated circuitsVarma, P.1984621.31042Integrated circuit testsUniversity of Manchesterhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.352018Electronic Thesis or Dissertation
collection NDLTD
sources NDLTD
topic 621.31042
Integrated circuit tests
spellingShingle 621.31042
Integrated circuit tests
Varma, P.
On-chip testing of very large scale integrated circuits
author Varma, P.
author_facet Varma, P.
author_sort Varma, P.
title On-chip testing of very large scale integrated circuits
title_short On-chip testing of very large scale integrated circuits
title_full On-chip testing of very large scale integrated circuits
title_fullStr On-chip testing of very large scale integrated circuits
title_full_unstemmed On-chip testing of very large scale integrated circuits
title_sort on-chip testing of very large scale integrated circuits
publisher University of Manchester
publishDate 1984
url http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.352018
work_keys_str_mv AT varmap onchiptestingofverylargescaleintegratedcircuits
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