Electron Microscopy of Low Energy Ion Damage in Metals

Bibliographic Details
Main Author: Thomas, G. J.
Published: University of Sussex 1969
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.474974
id ndltd-bl.uk-oai-ethos.bl.uk-474974
record_format oai_dc
spelling ndltd-bl.uk-oai-ethos.bl.uk-4749742017-12-24T16:26:10ZElectron Microscopy of Low Energy Ion Damage in MetalsThomas, G. J.1969University of Sussexhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.474974Electronic Thesis or Dissertation
collection NDLTD
sources NDLTD
author Thomas, G. J.
spellingShingle Thomas, G. J.
Electron Microscopy of Low Energy Ion Damage in Metals
author_facet Thomas, G. J.
author_sort Thomas, G. J.
title Electron Microscopy of Low Energy Ion Damage in Metals
title_short Electron Microscopy of Low Energy Ion Damage in Metals
title_full Electron Microscopy of Low Energy Ion Damage in Metals
title_fullStr Electron Microscopy of Low Energy Ion Damage in Metals
title_full_unstemmed Electron Microscopy of Low Energy Ion Damage in Metals
title_sort electron microscopy of low energy ion damage in metals
publisher University of Sussex
publishDate 1969
url http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.474974
work_keys_str_mv AT thomasgj electronmicroscopyoflowenergyiondamageinmetals
_version_ 1718576486496075776