Electron Microscopy of Low Energy Ion Damage in Metals
Main Author: | Thomas, G. J. |
---|---|
Published: |
University of Sussex
1969
|
Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.474974 |
Similar Items
-
Advanced transmission electron microscopy studies in low-energy ion implanted Si
by: Wang, Te-Sheng
Published: (2002) -
Electron microscopy studies of void formation in some ion-bombarded metals
by: Mazey, D. J.
Published: (1975) -
Cross-section transmission electron microscopy of the ion implantation damage in annealed diamond
by: Nshingabigwi, Emmanuel Korawinga
Published: (2014) -
Ionization damage mechanisms in electron microscopy
by: Rocca, F. J.
Published: (1985) -
Helium ion microscopy and energy selective scanning electron microscopy - two advanced microscopy techniques with complementary applications
by: Rodenburg, C., et al.
Published: (2014)