A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface

Bibliographic Details
Main Author:	Gandy, Amy S.
Published:	University of Salford 2008
Subjects:	620.112
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.502784

id	ndltd-bl.uk-oai-ethos.bl.uk-502784
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-5027842015-03-20T05:04:15ZA Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous InterfaceGandy, Amy S.2008620.112University of Salfordhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.502784Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	620.112
spellingShingle	620.112 Gandy, Amy S. A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface
author	Gandy, Amy S.
author_facet	Gandy, Amy S.
author_sort	Gandy, Amy S.
title	A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface
title_short	A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface
title_full	A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface
title_fullStr	A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface
title_full_unstemmed	A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface
title_sort	transmission electron microscopy study of the interaction between defects in amorphous silicon and a moving crystalline/amorphous interface
publisher	University of Salford
publishDate	2008
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.502784
work_keys_str_mv	AT gandyamys atransmissionelectronmicroscopystudyoftheinteractionbetweendefectsinamorphoussiliconandamovingcrystallineamorphousinterface AT gandyamys transmissionelectronmicroscopystudyoftheinteractionbetweendefectsinamorphoussiliconandamovingcrystallineamorphousinterface
_version_	1716788773925158912

A Transmission Electron Microscopy study of the Interaction between Defects in Amorphous Silicon and a Moving Crystalline/Amorphous Interface

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