Characterisation of defects and time-dependent variability of nano-meter MOSFETs
Main Author: | |
---|---|
Published: |
Liverpool John Moores University
2013
|
Subjects: | |
Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.601334 |
id |
ndltd-bl.uk-oai-ethos.bl.uk-601334 |
---|---|
record_format |
oai_dc |
spelling |
ndltd-bl.uk-oai-ethos.bl.uk-6013342017-10-04T03:45:54ZCharacterisation of defects and time-dependent variability of nano-meter MOSFETsDuan, Meng2013621.3815Liverpool John Moores Universityhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.601334Electronic Thesis or Dissertation |
collection |
NDLTD |
sources |
NDLTD |
topic |
621.3815 |
spellingShingle |
621.3815 Duan, Meng Characterisation of defects and time-dependent variability of nano-meter MOSFETs |
author |
Duan, Meng |
author_facet |
Duan, Meng |
author_sort |
Duan, Meng |
title |
Characterisation of defects and time-dependent variability of nano-meter MOSFETs |
title_short |
Characterisation of defects and time-dependent variability of nano-meter MOSFETs |
title_full |
Characterisation of defects and time-dependent variability of nano-meter MOSFETs |
title_fullStr |
Characterisation of defects and time-dependent variability of nano-meter MOSFETs |
title_full_unstemmed |
Characterisation of defects and time-dependent variability of nano-meter MOSFETs |
title_sort |
characterisation of defects and time-dependent variability of nano-meter mosfets |
publisher |
Liverpool John Moores University |
publishDate |
2013 |
url |
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.601334 |
work_keys_str_mv |
AT duanmeng characterisationofdefectsandtimedependentvariabilityofnanometermosfets |
_version_ |
1718545979142045696 |