Characterisation of defects and time-dependent variability of nano-meter MOSFETs

Bibliographic Details
Main Author:	Duan, Meng
Published:	Liverpool John Moores University 2013
Subjects:	621.3815
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.601334

id	ndltd-bl.uk-oai-ethos.bl.uk-601334
record_format	oai_dc
spelling	ndltd-bl.uk-oai-ethos.bl.uk-6013342017-10-04T03:45:54ZCharacterisation of defects and time-dependent variability of nano-meter MOSFETsDuan, Meng2013621.3815Liverpool John Moores Universityhttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.601334Electronic Thesis or Dissertation
collection	NDLTD
sources	NDLTD
topic	621.3815
spellingShingle	621.3815 Duan, Meng Characterisation of defects and time-dependent variability of nano-meter MOSFETs
author	Duan, Meng
author_facet	Duan, Meng
author_sort	Duan, Meng
title	Characterisation of defects and time-dependent variability of nano-meter MOSFETs
title_short	Characterisation of defects and time-dependent variability of nano-meter MOSFETs
title_full	Characterisation of defects and time-dependent variability of nano-meter MOSFETs
title_fullStr	Characterisation of defects and time-dependent variability of nano-meter MOSFETs
title_full_unstemmed	Characterisation of defects and time-dependent variability of nano-meter MOSFETs
title_sort	characterisation of defects and time-dependent variability of nano-meter mosfets
publisher	Liverpool John Moores University
publishDate	2013
url	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.601334
work_keys_str_mv	AT duanmeng characterisationofdefectsandtimedependentvariabilityofnanometermosfets
_version_	1718545979142045696

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