Temperature effects in thin films of silicon oxide
The use of thin film capacitors as a component in microminiaturized electrical circuits has made it necessary to obtain a more complete understanding of the conduction mechanisms occurring in these films. Silicon oxide was chosen as the dielectric material for study and the temperature behaviour of...
Main Author: | Morley, Alan Richard |
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Published: |
Imperial College London
1968
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Subjects: | |
Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.623094 |
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