A study of compositional variations in semiconductor heterostructures by transmission electron microscopy

Bibliographic Details
Main Author: Walther, Thomas
Published: University of Cambridge 1997
Subjects:
669
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.627131
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spelling ndltd-bl.uk-oai-ethos.bl.uk-6271312015-11-03T04:19:11ZA study of compositional variations in semiconductor heterostructures by transmission electron microscopyWalther, Thomas1997669University of Cambridgehttp://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.627131Electronic Thesis or Dissertation
collection NDLTD
sources NDLTD
topic 669
spellingShingle 669
Walther, Thomas
A study of compositional variations in semiconductor heterostructures by transmission electron microscopy
author Walther, Thomas
author_facet Walther, Thomas
author_sort Walther, Thomas
title A study of compositional variations in semiconductor heterostructures by transmission electron microscopy
title_short A study of compositional variations in semiconductor heterostructures by transmission electron microscopy
title_full A study of compositional variations in semiconductor heterostructures by transmission electron microscopy
title_fullStr A study of compositional variations in semiconductor heterostructures by transmission electron microscopy
title_full_unstemmed A study of compositional variations in semiconductor heterostructures by transmission electron microscopy
title_sort study of compositional variations in semiconductor heterostructures by transmission electron microscopy
publisher University of Cambridge
publishDate 1997
url http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.627131
work_keys_str_mv AT waltherthomas astudyofcompositionalvariationsinsemiconductorheterostructuresbytransmissionelectronmicroscopy
AT waltherthomas studyofcompositionalvariationsinsemiconductorheterostructuresbytransmissionelectronmicroscopy
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