Total ionizing dose and single event upset testing of flash based field programmable gate arrays

• Main Author: Van Aardt, Stefan
• Format: Others
• Language: English
• Published: Nelson Mandela Metropolitan University 2015
• Subjects: Field programmable gate arrays; Application-specific integrated circuits
• Online Access: http://hdl.handle.net/10948/12548

The effectiveness of implementing field programmable gate arrays (FPGAs) in communication, military, space and high radiation environment applications, coupled with the increased accessibility of private individuals and researchers to launch satellites, has led to an increased interest in commercial off the shelf components. The metal oxide semiconductor (MOS) structures of FPGAs however, are sensitive to radiation effects which can lead to decreased reliability of the device. In order to successfully implement a FPGA based system in a radiation environment, such as on-board a satellite, the single event upset (SEU) and total ionizing dose (TID) characteristics of the device must first be established. This research experimentally determines a research procedure which could accurately determine the SEU cross sections and TID characteristics of various mitigation techniques as well as control circuits implemented in a ProASIC3 A3P1000 FPGA. To gain an understanding of the SEU effects of the implemented circuits, the test FPGA was irradiated by a 66MeV proton beam at the iTemba LABS facility. Through means of irradiation, the SEU cross section of various communication, motor control and mitigation schemes circuits, induced by high energy proton strikes was investigated. The implementation of a full global triple modular redundancy (TMR) and a combination of TMR and a AND-OR multiplexer filter was found to most effectively mitigate SEUs in comparison to the other techniques. When comparing the communication and motor control circuits, the high frequency I2C and SPI circuits experienced a higher number of upsets when compared to a low frequency servo motor control circuit. To gain a better understanding of the absorbed dose effects, experimental TID testing was conducted by irradiating the test FPGA with a cobalt-60 (Co-60) source. An accumulated absorbed dose resulted in the fluctuation of the device supply current and operating voltages as well as resulted in output errors. The TMR and TMR filtering combination mitigation techniques again were found to be the most effective methods of mitigation.