Time-resolved reflectivity measurement of extrinsic silicon during pulsed laser irradiation

Time-resolved reflectivity measurement of extrinsic silicon during pulsed laser irradiation

Bibliographic Details
Main Authors:	Johnson, Geoffrey Davis, Chenoweth, Emory Leigh
Other Authors:	NA
Language:	en_US
Published:	Monterey, California. Naval Postgraduate School 2012
Online Access:	http://hdl.handle.net/10945/19594

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