The Development of Embedded DRAM Statistical Quality Models at Test and Use Conditions
Today, the use of embedded Dynamic Random Access Memory (eDRAM) is increasing in our electronics that require large memories, such as gaming consoles and computer network routers. Unlike external DRAMs, eDRAMs are embedded inside ASICs for faster read and write operations. Until recently, eDRAMs req...
Main Author: | Suzuki, Satoshi |
---|---|
Format: | Others |
Published: |
PDXScholar
2010
|
Subjects: | |
Online Access: | https://pdxscholar.library.pdx.edu/open_access_etds/341 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1340&context=open_access_etds |
Similar Items
-
Extending Non-Volatile Operation to DRAM Cells
by: Wei Wei, et al.
Published: (2013-01-01) -
Challenges and Applications of Emerging Nonvolatile Memory Devices
by: Writam Banerjee
Published: (2020-06-01) -
DRAM-aware prefetching and cache management
by: Lee, Chang Joo, 1975-
Published: (2011) -
Polycrystalline-Silicon-MOSFET-Based Capacitorless DRAM With Grain Boundaries and Its Performances
by: Sang Ho Lee, et al.
Published: (2021-01-01) -
A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process
by: Meng-Yin Hsu, et al.
Published: (2017-06-01)