Measurement Techniques for Noise Figure and Gain of Bipolar Transistors

• Main Author: Jung, Wayne Kan
• Format: Others
• Published: PDXScholar 1993
• Subjects: Bipolar transistors > Noise > Measurement; Pascal (Computer program language); Electrical and Computer Engineering
• Online Access: https://pdxscholar.library.pdx.edu/open_access_etds/4592; https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=5663&context=open_access_etds

First, the concepts of reflection coefficients, s-parameters, Smith chart, noise figure, and available power gain will be introduced. This lays out the foundation for the presentation of techniques on measuring noise figure and gain of high speed bipolar junction transistors. Noise sources in a bipolar junction transistor and an equivalent circuit including these noise sources will be presented. The process of determining the noise parameters of a transistor will also be discussed. A Pascal program and several TEKSPICE scripts are developed to calculate the stability, available power gain, and noise figure circles. Finally, these circles are plotted on a Smith chart to give a clear view of how a transistor will perform due to a change in source impedances.