EVALUATION OF SOYBEAN RECOMBINANT INBRED LINES FOR YIELD POTENTIAL AND RESISTANCE TO SUDDEN DEATH SYNDROME

• Main Author: Anderson, James Arthur
• Format: Others
• Published: OpenSIUC 2012
• Subjects: RIL; SDS; Soybean; Yield
• Online Access: https://opensiuc.lib.siu.edu/theses/837; https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=1845&context=theses

Evaluation of soybean recombinant inbred lines for seed weight yield, agronomic traits, and resistance to sudden death syndrome Sudden death syndrome (SDS) caused by Fusarium virguliforme is a devastating disease in soybean (Glycine max (L.) Merr.) that causes up to 70% of yield losses depending on the developmental stage when the plant become infected. The characterization of resistance is greatly significant for disease management. Therefore, three populations were developed by crossing three resistant lines, `Hamilton', LS90-1920 and LS97-1610 with a susceptible line to SDS, `Spencer'. Ninety-four F5:6 recombinant inbred lines from each population (Hamilton x Spencer, LS90-1920 x Spencer, and LS97-1610 x Spencer) were evaluated for two years (2009 and 2010) at two locations (Carbondale and Valmeyer) in southern Illinois. Population statistics, genotype x environment interaction, and broad-sense heritability were used to reveal any major resistance genes. Genetic correlation coefficients of SDS resistance with important agronomic traits such as lodging, pubescence, growth habit, and plant height were also calculated. The information from this study will be helpful to breeders in developing populations for genetic analyses and enforcing selection practices.