Progress in x-ray spectroscopies for the study of advanced materials

This thesis work is focused on the use of selected core-level x-ray spectroscopies to study semiconductor materials of great technological interest and on the development of a new implementation of appearance potential spectroscopy. Core-level spectroscopies can be exploited to study these material...

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Main Author: Amidani, Lucia <1985>
Other Authors: Boscherini, Federico
Format: Doctoral Thesis
Language:en
Published: Alma Mater Studiorum - Università di Bologna 2013
Subjects:
Online Access:http://amsdottorato.unibo.it/5188/
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spelling ndltd-unibo.it-oai-amsdottorato.cib.unibo.it-51882016-04-27T05:14:01Z Progress in x-ray spectroscopies for the study of advanced materials Amidani, Lucia <1985> FIS/03 Fisica della materia This thesis work is focused on the use of selected core-level x-ray spectroscopies to study semiconductor materials of great technological interest and on the development of a new implementation of appearance potential spectroscopy. Core-level spectroscopies can be exploited to study these materials with a local approach since they are sensitive to the electronic structure localized on a chemical species present in the sample examined. This approach, in fact, provides important micro-structural information that is difficult to obtain with techniques sensitive to the average properties of materials. In this thesis work we present a novel approach to the study of semiconductors with core-level spectroscopies based on an original analysis procedure that leads to an insightful understanding of the correlation between the local micro-structure and the spectral features observed. In particular, we studied the micro-structure of Hydrogen induced defects in nitride semiconductors, since the analysed materials show substantial variations of optical and electronic properties as a consequence of H incorporation. Finally, we present a novel implementation of soft x-ray appearance potential spectroscopy, a core-level spectroscopy that uses electrons as a source of excitation and has the great advantage of being an in-house technique. The original set-up illustrated was designed to reach a high signal-to-noise ratio for the acquisition of good quality spectra that can then be analyzed in the framework of the real space full multiple scattering theory. This technique has never been coupled with this analysis approach and therefore our work unite a novel implementation with an original data analysis method, enlarging the field of application of this technique. Alma Mater Studiorum - Università di Bologna Boscherini, Federico 2013-02-21 Doctoral Thesis PeerReviewed application/pdf en http://amsdottorato.unibo.it/5188/ info:eu-repo/semantics/openAccess
collection NDLTD
language en
format Doctoral Thesis
sources NDLTD
topic FIS/03 Fisica della materia
spellingShingle FIS/03 Fisica della materia
Amidani, Lucia <1985>
Progress in x-ray spectroscopies for the study of advanced materials
description This thesis work is focused on the use of selected core-level x-ray spectroscopies to study semiconductor materials of great technological interest and on the development of a new implementation of appearance potential spectroscopy. Core-level spectroscopies can be exploited to study these materials with a local approach since they are sensitive to the electronic structure localized on a chemical species present in the sample examined. This approach, in fact, provides important micro-structural information that is difficult to obtain with techniques sensitive to the average properties of materials. In this thesis work we present a novel approach to the study of semiconductors with core-level spectroscopies based on an original analysis procedure that leads to an insightful understanding of the correlation between the local micro-structure and the spectral features observed. In particular, we studied the micro-structure of Hydrogen induced defects in nitride semiconductors, since the analysed materials show substantial variations of optical and electronic properties as a consequence of H incorporation. Finally, we present a novel implementation of soft x-ray appearance potential spectroscopy, a core-level spectroscopy that uses electrons as a source of excitation and has the great advantage of being an in-house technique. The original set-up illustrated was designed to reach a high signal-to-noise ratio for the acquisition of good quality spectra that can then be analyzed in the framework of the real space full multiple scattering theory. This technique has never been coupled with this analysis approach and therefore our work unite a novel implementation with an original data analysis method, enlarging the field of application of this technique.
author2 Boscherini, Federico
author_facet Boscherini, Federico
Amidani, Lucia <1985>
author Amidani, Lucia <1985>
author_sort Amidani, Lucia <1985>
title Progress in x-ray spectroscopies for the study of advanced materials
title_short Progress in x-ray spectroscopies for the study of advanced materials
title_full Progress in x-ray spectroscopies for the study of advanced materials
title_fullStr Progress in x-ray spectroscopies for the study of advanced materials
title_full_unstemmed Progress in x-ray spectroscopies for the study of advanced materials
title_sort progress in x-ray spectroscopies for the study of advanced materials
publisher Alma Mater Studiorum - Università di Bologna
publishDate 2013
url http://amsdottorato.unibo.it/5188/
work_keys_str_mv AT amidanilucia1985 progressinxrayspectroscopiesforthestudyofadvancedmaterials
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