Patch-based nonlocal estimation of scattering mechanism vector in PolInSAR

Nowadays, polarimetric interferometric synthetic aperture radar (PolInSAR) has attracted increasing attention for the simultaneous acquisition of scattering and terrain information. The scattering mechanism vectors corresponding to the optimal coherences have shown great effect in land cover classif...

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Bibliographic Details
Main Authors: Lu, D. (Author), Wang, H. (Author), Xing, C. (Author), Yang, J. (Author), Yin, J. (Author)
Format: Article
Language:English
Published: John Wiley and Sons Inc 2023
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Online Access:View Fulltext in Publisher
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Summary:Nowadays, polarimetric interferometric synthetic aperture radar (PolInSAR) has attracted increasing attention for the simultaneous acquisition of scattering and terrain information. The scattering mechanism vectors corresponding to the optimal coherences have shown great effect in land cover classification and forest mapping. To extract scattering mechanism vectors, different optimization algorithms are proposed but always accompanied with spatial discontinuities. This letter proposes a method to optimize scattering mechanism vectors based on nonlocal estimations. A pixel-by-pixel optimization model is established by calculating patch-based nonlocal similarity, which effectively reduces the uncertainty of scattering mechanism vector estimation while maintaining high resolution. The phase recovery experiment is conducted on simulated data and the root mean square errors (RMSEs) of three algorithms are compared. The proposed method performs better with a RMSE of 0.22 in the whole image, against 0.25 and 1.27 for other algorithms. The recovery results in the target region (RMSE 0.11 against 0.21 and 0.99) and linear edge region (RMSE 0.26 against 0.49 and 1.52) also indicate strong ability in detail preservation. Then the observed ESAR data is utilized for further assessment. It demonstrates that the proposed method has a significant improvement to reduce singularities and distinguish artificial buildings. © 2023 The Authors. Electronics Letters published by John Wiley & Sons Ltd on behalf of The Institution of Engineering and Technology.
ISBN:00135194 (ISSN)
ISSN:00135194 (ISSN)
DOI:10.1049/ell2.12782