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| LEADER |
02035nam a2200361Ia 4500 |
| 001 |
10.1063-5.0087187 |
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220425s2022 CNT 000 0 und d |
| 020 |
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|a 00036951 (ISSN)
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| 245 |
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|a Pseudoheterodyne near-field imaging at kHz repetition rates via quadrature-assisted discrete demodulation
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| 260 |
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|b American Institute of Physics Inc.
|c 2022
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| 856 |
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|z View Fulltext in Publisher
|u https://doi.org/10.1063/5.0087187
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|a Scattering-type scanning near-field optical microscopy enables the measurement of optical constants of a surface beyond the diffraction limit. Its compatibility with pulsed sources is hampered by the requirement of a high-repetition rate imposed by lock-in detection. We describe a sampling method, called quadrature-assisted discrete (quad) demodulation, which circumvents this constraint. Quad demodulation operates by measuring the optical signal and the modulation phases for each individual light pulse. This method retrieves the near-field signal in the pseudoheterodyne mode, as proven by retraction curves and near-field images. Measurement of the near-field using a pulsed femtosecond amplifier and quad demodulation is in agreement with results obtained using a CW laser and the standard lock-in detection method. © 2022 Author(s).
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|a Continuous wave lasers
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|a Demodulation
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|a Diffraction
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|a Diffraction limits
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|a High repetition rate
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|a Lock-in detection
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|a Measurements of
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|a Near field imaging
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|a Near field scanning optical microscopy
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|a Optical heterodyning
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|a Optical variables measurement
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|a Pseudo-heterodyne
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|a Pulsed source
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|a Repetition rate
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|a Sampling method
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|a Scanning near-field optical microscopy
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|a Grosse, N.B.
|e author
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|a Palato, S.
|e author
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|a Schwendke, P.
|e author
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|a Stähler, J.
|e author
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| 773 |
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|t Applied Physics Letters
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