A New Intensity Adjustment Technique of Emission Spectral Analysis When Measured at the Upper Limit of the Dynamic Range of Charge-Coupled Devices
The article presents a method of mathematical correction to be applied to the results of measuring the intensity of spectral lines using charge-coupled devices (CCDs) in the presence of the blooming effect. This technique is particularly applicable in atomic emission spectroscopy. It enables expansi...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
MDPI
2022
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Subjects: | |
Online Access: | View Fulltext in Publisher |