Microstructure Representation Knowledge Graph to Explore the Twinning Formation

Deformation twinning is an important mechanism of the plastic deformation of materials. The density of twins also affects the properties of the material. At present, the research methods of deformation twinning mainly depend on in situ EBSD, numerically investigated analysis and the finite element m...

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Bibliographic Details
Main Authors: Pan, Z. (Author), Shu, C. (Author), Xie, C. (Author)
Format: Article
Language:English
Published: MDPI 2022
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Online Access:View Fulltext in Publisher
Description
Summary:Deformation twinning is an important mechanism of the plastic deformation of materials. The density of twins also affects the properties of the material. At present, the research methods of deformation twinning mainly depend on in situ EBSD, numerically investigated analysis and the finite element method. The application of machine learning methods to material microstructure research can shorten the time taken for material analysis. Machine learning methods are faced with the problem of the effective representation of the microstructure. We present a deformation twinning research method based on the representation of grain morphology features in a knowledge graph. We construct an autoencoder to extract grain morphology characteristics for building a grain knowledge graph. Then, a graph convolutional network (GCN) and fully connected network are developed to extract grain knowledge graph features and predict the twin density of materials subjected to specific tensile deformation. We use Mg-2Zn-3Li alloy as an experimental example to predict the twin density on three indexes of average grain size, twin boundaries density and average grain surface. The R2 score of the prediction result on the twin boundaries density is up to 0.510, and the R2 score of the average grain size and average grain surface is over 0.750. Therefore, the proposed method for deformation twinning research is effective and feasible. © 2022 by the authors. Licensee MDPI, Basel, Switzerland.
ISBN:20734352 (ISSN)
DOI:10.3390/cryst12040466