Automatic Detection and Identification of Defects by Deep Learning Algorithms from Pulsed Thermography Data

Infrared thermography (IRT), is one of the most interesting techniques to identify different kinds of defects, such as delamination and damage existing for quality management of material. Objective detection and segmentation algorithms in deep learning have been widely applied in image processing, a...

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Bibliographic Details
Main Authors: Duan, Y. (Author), Fang, Q. (Author), Garrido, I. (Author), Ibarra-Castanedo, C. (Author), Maldague, X. (Author)
Format: Article
Language:English
Published: MDPI 2023
Subjects:
Online Access:View Fulltext in Publisher
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LEADER 03621nam a2200529Ia 4500
001 10.3390-s23094444
008 230529s2023 CNT 000 0 und d
020 |a 14248220 (ISSN) 
245 1 0 |a Automatic Detection and Identification of Defects by Deep Learning Algorithms from Pulsed Thermography Data 
260 0 |b MDPI  |c 2023 
856 |z View Fulltext in Publisher  |u https://doi.org/10.3390/s23094444 
856 |z View in Scopus  |u https://www.scopus.com/inward/record.uri?eid=2-s2.0-85159190135&doi=10.3390%2fs23094444&partnerID=40&md5=2fb124d6706b82c556ab3fe1a21341d6 
520 3 |a Infrared thermography (IRT), is one of the most interesting techniques to identify different kinds of defects, such as delamination and damage existing for quality management of material. Objective detection and segmentation algorithms in deep learning have been widely applied in image processing, although very rarely in the IRT field. In this paper, spatial deep-learning image processing methods for defect detection and identification were discussed and investigated. The aim in this work is to integrate such deep-learning (DL) models to enable interpretations of thermal images automatically for quality management (QM). That requires achieving a high enough accuracy for each deep-learning method so that they can be used to assist human inspectors based on the training. There are several alternatives of deep Convolutional Neural Networks for detecting the images that were employed in this work. These included: 1. The instance segmentation methods Mask–RCNN (Mask Region-based Convolutional Neural Networks) and Center–Mask; 2. The independent semantic segmentation methods: U-net and Resnet–U-net; 3. The objective localization methods: You Only Look Once (YOLO-v3) and Faster Region-based Convolutional Neural Networks (Fast-er-RCNN). In addition, a regular infrared image segmentation processing combination method (Absolute thermal contrast (ATC) and global threshold) was introduced for comparison. A series of academic samples composed of different materials and containing artificial defects of different shapes and nature (flat-bottom holes, Teflon inserts) were evaluated, and all results were studied to evaluate the efficacy and performance of the proposed algorithms. © 2023 by the authors. 
650 0 4 |a automatic defect identification and segmentation 
650 0 4 |a Automatic defect identification and segmentation 
650 0 4 |a Convolution 
650 0 4 |a convolutional neural network 
650 0 4 |a Convolutional neural network 
650 0 4 |a Convolutional neural networks 
650 0 4 |a Deep learning 
650 0 4 |a Deep-learning non-destructive evaluation 
650 0 4 |a deep-learning non-destructive evaluation (NDE) 
650 0 4 |a Defect identification 
650 0 4 |a Defects 
650 0 4 |a Detection and identifications 
650 0 4 |a Image quality 
650 0 4 |a infrared image processing 
650 0 4 |a Infrared image processing 
650 0 4 |a infrared thermography 
650 0 4 |a Learning algorithms 
650 0 4 |a Learning systems 
650 0 4 |a Non destructive evaluation 
650 0 4 |a Nondestructive examination 
650 0 4 |a pulsed thermography 
650 0 4 |a Pulsed thermography 
650 0 4 |a Quality management 
650 0 4 |a Region-based 
650 0 4 |a Segmentation methods 
650 0 4 |a Semantic Segmentation 
650 0 4 |a Semantics 
650 0 4 |a Thermography (imaging) 
700 1 0 |a Duan, Y.  |e author 
700 1 0 |a Fang, Q.  |e author 
700 1 0 |a Garrido, I.  |e author 
700 1 0 |a Ibarra-Castanedo, C.  |e author 
700 1 0 |a Maldague, X.  |e author 
773 |t Sensors