In situ loss measurement of direct UV written waveguides using integrated Bragg gratings
The propagation loss of a direct UV-written silica-on-silicon waveguide is measured using an elegant nondestructive method. The technique uses integrated Bragg grating structures, which are observed from opposing launch directions to obtain information about the optical power at different positions...
Main Authors: | Rogers, H.L (Author), Ambran, S. (Author), Holmes, C. (Author), Smith, P.G.R (Author), Gates, J.C (Author) |
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Format: | Article |
Language: | English |
Published: |
2010-09.
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Subjects: | |
Online Access: | Get fulltext |
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