Semi-automatic attenuation of cochlear implant artifacts for the evaluation of late auditory evoked potentials
Electrical artifacts caused by the cochlear implant (CI) contaminate electroencephalographic (EEG) recordings from implanted individuals and corrupt auditory evoked potential (AEPs). Independent component analysis (ICA) is efficient in attenuating the electrical CI artifact and AEPs can be successfu...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
2012-02.
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| Subjects: | |
| Online Access: | Get fulltext |