Schottky diode back contacts for high frequency capacitance studies on semiconductors
A technique using large area Schottky diode back contacts has been developed to enable high frequency capacitance studies to be carried out on semiconductors without the need to fabricate high quality ohmic back contacts. This technique will find application for very high resistivity materials or fo...
Main Authors: | Mallik, Kanad (Author), Falster, R.J (Author), Wilshaw, P.R (Author) |
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Format: | Article |
Language: | English |
Published: |
2004-02.
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Subjects: | |
Online Access: | Get fulltext |
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