Gallium-diffused waveguides in sapphire

The fabrication and characterisation of gallium-diffused planar waveguides in sapphire is reported. Waveguides were fabricated by diffusion of 60nm - 200nm thick films of gallium oxide into c-cut sapphire at 1600°C for times ranging between 6 and 16 hours. Near-field intensity profiles of the guided...

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Bibliographic Details
Main Authors: Apostolopoulos, V. (Author), Hickey, L.M.B (Author), Sager, D.A (Author), Wilkinson, J.S (Author)
Format: Article
Language:English
Published: 2001.
Subjects:
Online Access:Get fulltext
LEADER 01067 am a22001693u 4500
001 268005
042 |a dc 
100 1 0 |a Apostolopoulos, V.  |e author 
700 1 0 |a Hickey, L.M.B.  |e author 
700 1 0 |a Sager, D.A.  |e author 
700 1 0 |a Wilkinson, J.S.  |e author 
245 0 0 |a Gallium-diffused waveguides in sapphire 
260 |c 2001. 
856 |z Get fulltext  |u https://eprints.soton.ac.uk/268005/1/2306.pdf 
520 |a The fabrication and characterisation of gallium-diffused planar waveguides in sapphire is reported. Waveguides were fabricated by diffusion of 60nm - 200nm thick films of gallium oxide into c-cut sapphire at 1600°C for times ranging between 6 and 16 hours. Near-field intensity profiles of the guided modes were measured at wavelengths between 488nm and 850nm, and the surface index elevation was estimated to be up to (0.6±0.02)x10<sup>-2</sup>. Potential applications for low-threshold Ti:sapphire waveguide lasers and for optical integrated circuits with passive and active elements in sapphire are discussed. 
540 |a accepted_manuscript 
655 7 |a Article