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01354 am a22002173u 4500 |
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386307 |
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|a Butt, M.A.
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|a Pujol, M.C.
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|a Solé, R.
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|a Ródenas, A.
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|a Lifante, G.
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|a Wilkinson, J.S.
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|a Aguiló, M.
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|a Díaz, F.
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|a Channel waveguides and Mach-Zehnder structures on RbTiOPO<sub>4</sub> by Cs<sup>+</sup> ion exchange
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|c 2015-04-22.
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|u https://eprints.soton.ac.uk/386307/1/ome-5-5-1183.pdf
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|a Cs<sup>+</sup> ion exchange in RbTiOPO<sub>4</sub> and (Yb,Nb):RTP/RTP(001) has been used to locally increase the refractive indices for waveguide circuit fabrication. Ti masks were fabricated on RTP samples by conventional photolithography. Cs<sup>+</sup> exchange was done using a CsNO<sub>3</sub> melt at 698 K during 2 h. Elemental analysis confirms an Cs<sup>+</sup> profile with a variable depth. Apparently the Cs<sup>+</sup> exchange is disfavored in the doped epitaxial sample. The refractive index variation is higher for nz than for nx,y. Near-field images of the guided modes at 633, 1064 and 1520 nm were recorded. The optical characterization shows propagation losses of 5 dB/cm at 1520 nm.
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