Ablated gratings on borosilicate glass by 193nm excimer laser radiation

Relief gratings of 500nm period have been fabricated on Er/Yb-doped borosilicate glass substrates by laser ablation using an excimer laser at a wavelength of 193nm and a modified Mach-Zehnder interferometer. The grating fabrication process has been quantified using diffraction efficiency measurement...

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Bibliographic Details
Main Authors: Pissadakis, S. (Author), Reekie, L. (Author), Hempstead, M. (Author), Zervas, M.N (Author), Wilkinson, J.S (Author)
Format: Article
Language:English
Published: 1999-12.
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Summary:Relief gratings of 500nm period have been fabricated on Er/Yb-doped borosilicate glass substrates by laser ablation using an excimer laser at a wavelength of 193nm and a modified Mach-Zehnder interferometer. The grating fabrication process has been quantified using diffraction efficiency measurements and atomic force microscope microscans, and related to the incident energy density.