Indium tin oxide films by sequential evaporation

In this paper, a method for preparing thin (16 nm) indium tin oxide (ITO) films for opto-electronic applications using sequential reactive evaporation followed by annealing is described. This method has the advantage of accurate composition control and low cost. An electrical resistivity of 4.0 x 10...

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Bibliographic Details
Main Authors: Yao, J.L (Author), Hao, S. (Author), Wilkinson, J.S (Author)
Format: Article
Language:English
Published: 1990-08-15.
Subjects:
Online Access:Get fulltext
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100 1 0 |a Yao, J.L.  |e author 
700 1 0 |a Hao, S.  |e author 
700 1 0 |a Wilkinson, J.S.  |e author 
245 0 0 |a Indium tin oxide films by sequential evaporation 
260 |c 1990-08-15. 
856 |z Get fulltext  |u https://eprints.soton.ac.uk/78429/1/428.pdf 
520 |a In this paper, a method for preparing thin (16 nm) indium tin oxide (ITO) films for opto-electronic applications using sequential reactive evaporation followed by annealing is described. This method has the advantage of accurate composition control and low cost. An electrical resistivity of 4.0 x 10<sup>-5</sup> Ω m and optical transparency greater than 90% have been obtained. The optical attenuation caused by the films deposited on top of ion-exchanged optical waveguides has been measured. This method has also been used for preparing thicker ITO films. 
655 7 |a Article