Quantifying the critical thickness of electron hybridization in spintronics materials

by T. Pincelli, V. Lollobrigida, F. Borgatti, A. Regoutz, B. Gobaut, C. Schlueter, T. -L. Lee, D. J. Payne, M. Oura, K. Tamasaku, A. Y. Petrov, P. Graziosi, F. Miletto Granozio, M. Cavallini, G. Vinai, R. Ciprian, C. H. Back, G. Rossi, M. Taguchi, H. Daimon, G. van der Laan, G. Panaccione
Published 2017-07-01