Suggested Topics within your search.
Suggested Topics within your search.
Atomic force microscopy
Cost effectiveness
1
Crystalline structure
1
Energy dispersive X ray analysis
1
Germanium
1
Heat treatment
1
High resolution X ray diffraction
1
High-speed devices
1
Magnetron sputtering
1
Nanostructures
1
Postgrowth annealing
1
Rapid thermal processing
1
Scanning electron microscopy
1
Self assembly
1
Semiconducting germanium
1
Si (100) substrate
1
SiGe nanostructures
1
Silicon
1
Silicon alloys
1
Single crystals
1
Sputtering
1
Structural and optical characterizations
1
Surface roughness
1
X ray analysis
1
X ray diffraction
1
rf-Magnetron sputtering
1
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