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Angot, Damien
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Fiabilité et variabilité temporelle des technologies CMOS FDSOI 28-20nm, du transistor au circuit intégré
by
Angot, Damien
Published 2014
“
...) des mémoires SRAM. === The
classical
CMOS structure is reaching its scaling limits at the 20nm node...
”
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Angot, Damien
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