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Fabrication and Characterization of GaN-Based Fin-Channel Array Metal-Oxide-Semiconductor High-Electron Mobility Transistors With Recessed-Gate and Ga₂O₃ Gate Insulat...
by
Hsin-Ying Lee
,
Ting-Wei Chang
,
Edward Yi Chang
,
Niklas Rorsman
,
Ching-Ting Lee
Published 2021-01-01
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