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Goyal, Vivek K.
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1
Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination
by
Agarwal, Akshay
,
Berggren, Karl K
,
van Staaden, Yuri J.
,
Goyal, Vivek K.
Published 2020
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2
On the Estimation of Nonrandom Signal Coefficients From Jittered Samples
by
Goyal, Vivek K.
,
Weller, Daniel Stuart
Published 2012
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Institutional Repositories
Author
Goyal, Vivek K.
Agarwal, Akshay
1
Berggren, Karl K
1
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
1
Massachusetts Institute of Technology. Research Laboratory of Electronics
1
Weller, Daniel Stuart
1
van Staaden, Yuri J.
1
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