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Grenoble
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Galand, Romain
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Caractérisation physique de la microstructure des interconnexions avancées Cu/Low-k pour l'étude des défaillances par électromigration
by
Galand, Romain
Published 2011
“
... alors pu être mis en
évidence
. Nous avons ensuite tenté de modifier la microstructure du cuivre pour...
”
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Galand, Romain
Grenoble
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