Showing
1 - 1
results of
1
for search '
CIRCUIT ANALYSIS
'
Skip to content
Home
High Impact Articles
Search Options
UiTM Open Access
Search by UiTM Scopus
Advanced Search
Search by Category
Discovery Service
Sources
Jawi Collection
UiTM Journals
List UiTM Journal in IR
Statistic
About
Open Access
Creative Commons Licenses
COKI | Malaysia Open Access
Report Technical
User Guide
Contact Us
Search Tips
FAQs
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Reset Filters
Author:
Grenoble Alpes
AND
Durand, Aurèle
Reset Filters
Show filters (2)
Author:
Grenoble Alpes
AND
Durand, Aurèle
Search Results - CIRCUIT ANALYSIS
Showing
1 - 1
results of
1
for search '
CIRCUIT ANALYSIS
'
, query time: 0.71s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
Call Number
Author
Title
1
Caractérisation et contrôle industriel des contraintes locales en microélectronique : applications aux transistors de technologie 20 nm
by
Durand, Aurèle
Published 2016
“
... microélectronique dans le but d’inspecter et analyser les
circuits
. Actuellement, la réduction des dimensions des...
”
Get full text
Search Tools:
Get RSS Feed
—
Email this Search
Back
Narrow Search
Sources
NDLTD
1
Collections
NDLTD
1
Author
Durand, Aurèle
Grenoble Alpes
Language
fr
1
Year of Publication
From:
To:
Loading...