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PRINCIPLES OF APPLIED ELECTRONICS
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Détermination de la résistance thermique d'une interface cristal/amorphe à l'aide de la dynamique moléculaire classique
by
Francioso, Pierre-Arnaud
Published 2014
“
.... In this thesis, we also
apply
classical MD to the case of silicon-on-insulator (SOI) transistors in order...
”
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