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PRINCIPLES OF APPLIED ELECTRONICS
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Nano caractérisation de matériaux pour le photovoltaïque par microscopie en champ proche et spectroscopie électronique : mesures de travail de sortie et de temps de vie de porteurs...
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Pouch, Sylvain
Published 2015
“
... is the local measurement of work function and carrier lifetime by atomic force microscopy and
electron
...
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