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180 nm
Build in self tests
1
Built-In Self-Test
Built-in self test
1
Builtin self tests (BIST)
CMOS
CMOS integrated circuits
1
Costs
1
Design flows
1
Design for testability
1
Harmonic analysis
1
Harmonic-Canceling filter
Harmonic-canceling filter
1
Integrated circuit design
Production cost
1
Semiconductor device manufacture
Semiconductor industry
1
Skew circulant matrix
Test applications
1
skew-circulant matrix
1
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1