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Carrier concentration
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Degradation
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Electric breakdown
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Electric lines
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Electrical parameter
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Impact ionization
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Interface states
Ionization effect
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LDMOS transistors
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Life-tests
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MOS devices
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Parameter shifts
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Power
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Power RF LDMOS
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RF-LDMOS
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Radar circuits
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Scattering parameters
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Silica
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Silicon oxides
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Temperature
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Temperature effects
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Thermal
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Thermal RF life-Test
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Thermal RF life-test
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Threshold voltage
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1by Belaïd, M.ASubjects: “...Electric breakdown...”
Published 2022
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