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Ions 2 Secondary ion mass spectrometry 2 Secondary ion-mass spectrometry Bayesian Analysis 1 Bayesian statistics 1 Charge state 1 Cluster ion beams 1 Depth profiling 1 Different sizes 1 Drops 1 Electrospray droplets 1 Electrospraying 1 Energy transfer 1 Fit parameters 1 Inert ions 1 Ion beam technique 1 Ion beams 1 Ion bombardment 1 Markov processes 1 Monoatomic solid target 1 Monoatomic solid targets 1 Performance 1 Photoionization 1 Semi-empirical formulas 1 Solid targets 1 Sputter yields 1 Sputter-depth profiling 1 Surface analysis 1 Water droplets 1 X ray photoelectron spectroscopy 1
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  1. 1
    Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model
    Sputter yields of monoatomic solids by Ar and Ne ions near the threshold: A Bayesian analysis of the Yamamura Model
    by Bijkerk, F., Phadke, P., Sturm, J.M, van de Kruijs, R.W.E, Zameshin, A.A
    Published 2022
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  2. 2
    Sputtering produced by vacuum electrospray droplet ions with different sizes and charges
    Sputtering produced by vacuum electrospray droplet ions with different sizes and charges
    by Chen, L.C, Hiraoka, K., Ninomiya, S.
    Published 2023
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Bijkerk, F. 1 Chen, L.C 1 Hiraoka, K. 1 Ninomiya, S. 1 Phadke, P. 1 Sturm, J.M 1 Zameshin, A.A 1 van de Kruijs, R.W.E 1 see all ...
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