180 nm 1 Build in self tests 1 Built-In Self-Test 1 Built-in self test 1 Builtin self tests (BIST) 1 CMOS 1 CMOS integrated circuits 1 Costs 1 Design flows 1 Design for testability 1 Harmonic analysis 1 Harmonic-Canceling filter 1 Harmonic-canceling filter 1 Integrated circuit design 1 Production cost 1 Schools 1 Semiconductor device manufacture 1 Semiconductor industry 1 Skew circulant matrix 1 Test applications 1 skew-circulant matrix 1