A Novel SiC Asymmetric Cell Trench MOSFET With Split Gate and Integrated JBS Diode

by Jinping Zhang, Zixun Chen, Yuanyuan Tu, Xiaochuan Deng, Bo Zhang
Published 2021-01-01

Low Loss and Low EMI Noise CSTBT With Split Gate and Recessed Emitter Trench

by Jinping Zhang, Xiang Xiao, Rongrong Zhu, Qian Zhao, Bo Zhang
Published 2021-01-01

Modeling the Displacement Damage on Trigger Current of Anode-Short MOS-Controlled Thyristor

by Lei Li, Ze Hong Li, Yu Zhou Wu, Xiao Chi Chen, Jin Ping Zhang, Min Ren, Yuan Jian, Bo Zhang
Published 2020-01-01

Low Loss Insulated Gate Bipolar Transistor With Electron Injection (EI-IGBT)

by Wanjun Chen, Hong Tao, Lunfei Lou, Chao Liu, Wu Cheng, Xuefeng Tang, Hongquan Liu, Qi Zhou, Xiaochuan Deng, Zhaoji Li, Bo Zhang
Published 2017-01-01

Ionization Damage Effects of Pulse Discharge Circuit Switched by Anode-Short MOS-Controlled Thyristor

by Lei Li, Ze-Hong Li, Jin-Ping Zhang, Yu-Zhou Wu, Xiao-Chi Chen, Min-Ren, Bo Zhang, Yuan Jian
Published 2020-01-01

Influence of the Acceptor-Type Trap on the Threshold Voltage of the Short-Channel GaN MOS-HEMT

by Yijun Shi, Wanjun Chen, Zhiwei Fu, Si Chen, Bo Zhang
Published 2021-01-01