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5by Tao Tian, Sheng-Li Zhang, Yu-Feng Guo, Jun Zhang, David Z. Pan, Ke-Meng Yang“...IEEE Journal of the Electron Devices Society...”
Published 2019-01-01
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6Analytical Study on the Breakdown Characteristics of Si-Substrated AlGaN/GaN HEMTs With Field Platesby Jianhua Liu, Yu-Feng Guo, Jun Zhang, Jiafei Yao, Maolin Zhang, Chenyang Huang, Ling Du“...IEEE Journal of the Electron Devices Society...”
Published 2020-01-01
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