Showing 1 - 20 results of 55 for search '"Integrated circuits Testing."', query time: 2.05s Refine Results
  1. 1
    Analysis of fault coverage masking in built-in self-test schemes
    by Cotsapas, Nicos.
    Published 1985
    Subjects: “...Integrated circuits -- Testing....”
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  2. 2
    Test support processor for enhanced testability of high performance integrated circuits
    by Zhou, Qing
    Published 2006
    Subjects: “...Integrated circuits Testing...”
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  3. 3
    Signature based testing of analog and RF circuits
    by Voorakaranam, Ramakrishna
    Published 2007
    Subjects: “...Integrated circuits Testing...”
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  4. 4
    Reliability and test of high-performance integrated circuits
    by Mohanram, Kartik
    Published 2008
    Subjects: “...Integrated circuits--Testing...”
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  5. 5
    Efficient backtracking strategies in test generation
    by Yu, Tein-Yow, 1961-
    Published 1989
    Subjects: “...Integrated circuits -- Testing....”
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  6. 6
    AN ANALYSIS OF A MULTILAYER DISTRIBUTED RC-NETWORK
    by Raghunath, Subramaniam, 1944-
    Published 1974
    Subjects: “...Integrated circuits -- Testing....”
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  7. 7
    Pseudo-functional testing: bridging the gap between manufacturing test and functional operation.
    Published 2009
    Subjects: “...Integrated circuits--Testing...”
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  8. 8
    An integrated random bit generator for applications in cryptography
    by Petrie, Craig Steven
    Published 2007
    Subjects: “...Integrated circuits Testing...”
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  9. 9
    HARDWARE COMPILER DRIVEN HEURISTIC SEARCH FOR DIGITAL IC TEST SEQUENCES.
    by Patel, Mayank Raman.
    Published 1985
    Subjects: “...Digital integrated circuits -- Testing....”
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  10. 10
    Structural thermal-electric modeling and analysis of micro-springs for microelectronic probing and packaging applications
    by Ahmad, Mudasir
    Published 2008
    Subjects: “...Integrated circuits Testing...”
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  11. 11
    Statistical prediction of integrated circuit performance based on circuit design and test structure evaluation
    by Gibson, David
    Published 2007
    Subjects: “...Integrated circuits Testing...”
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  12. 12
    COMPARISON OF SCIRTSS EFFICIENCY WITH D-ALGORITHM APPLICATION TO ITERATIVE NETWORKS (TEST).
    by Chen, Daven, 1959-
    Published 1986
    Subjects: “...Integrated circuits -- Testing....”
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  13. 13
    Sensitivity of SCIRTSS to weighted heuristic functions
    Subjects: “...Integrated circuits -- Testing....”
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  14. 14
    Optimizing the gain and Q-sensitivity to gain of a distributed- lumped-actived filter network
    by Day, John David, 1942-
    Published 1972
    Subjects: “...Integrated circuits -- Testing....”
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  15. 15
    The use of SEM in IC production testing: an in-dept theoretical study.
    Published 1994
    Subjects: “...Integrated circuits--Testing...”
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  16. 16
    High speed buffers for op-amp characterization
    by Rangan, Giri N. K.
    Published 2012
    Subjects: “...Linear integrated circuits -- Testing...”
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  17. 17
    COMPUTER ANALYSIS OF ACTIVE DEVICES FOR INTEGRATED THERMIONIC CIRCUITS
    by Feugate, Robert J., 1946-
    Published 1974
    Subjects: “...Integrated circuits -- Testing....”
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  18. 18
    INTELLIGENCE DRIVEN TEST SEQUENCE GENERATOR FOR VLSI (VECTOR, AUTOMATIC TESTING, SCAN DESIGN, FAULT SIMULATION, HEURISTIC SEARCH).
    by MOHSSENIBEHBAHANI, ALAA.
    Published 1984
    Subjects: “...Digital integrated circuits -- Testing....”
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  19. 19
    ALTERNATE SCREENING PROCEDURES FOR SEMICONDUCTOR VISUAL INSPECTION
    by Guarin, Fernando, 1954-
    Published 1987
    Subjects: “...Integrated circuits -- Testing....”
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  20. 20
    Efficient testing techniques for analog and mixed-signal circuits
    by Variyam, Pramodchandran
    Published 2007
    Subjects: “...Integrated circuits Testing...”
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