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1by Fawaz, Mohammad“...Electromigration in metal lines has re-emerged as a significant concern in modern VLSI circuits...”
Published 2013
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2by Fawaz, Mohammad“...Electromigration in metal lines has re-emerged as a significant concern in modern VLSI circuits...”
Published 2013
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3by Nadimpalli, SivaSubjects: “...Elastic-plastic finite element analysis...”
Published 2011
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4by Nadimpalli, SivaSubjects: “...Elastic-plastic finite element analysis...”
Published 2011
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5by Tomkins, Alexander“... system in 65-nm CMOS are presented. The design and analysis of shunt switches is presented with a...”
Published 2010
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6by Tomkins, Alexander“... system in 65-nm CMOS are presented. The design and analysis of shunt switches is presented with a...”
Published 2010
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11by Hassanpour Asl, Pezhman“... is studied. This model is employed for designing the experiment circuits for testing fabricated resonators...”
Published 2008
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12by Hassanpour Asl, Pezhman“... is studied. This model is employed for designing the experiment circuits for testing fabricated resonators...”
Published 2008
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13by Rebello, Joel“...This thesis presents the theoretical analysis and experiment results of MEMS sensors designed...”
Published 2009
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14by Rebello, Joel“...This thesis presents the theoretical analysis and experiment results of MEMS sensors designed...”
Published 2009
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17by Shrestha, Namrata“... and landscape connectivity, using a relatively novel circuit theoretic approach that can directly inform land...”
Published 2012
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18by Shrestha, Namrata“... and landscape connectivity, using a relatively novel circuit theoretic approach that can directly inform land...”
Published 2012
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