Suggested Topics within your search.
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Scanning electron microscopy
Semiconductor materials
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Field emission microscopes
4
Field emission scanning electron microscopy
4
Substrates
4
Annealing temperatures
3
Combustion method
3
Oxide films
3
Crystallite size
2
Energy gap
2
Field emission cathodes
2
Field emission scanning electron microscopes
2
Graphene
2
II-VI semiconductors
2
Lithium compounds
2
Morphology
2
Nickel compounds
2
Silicon substrates
2
Sputtering
2
Thin films
2
Titanium compounds
2
X ray diffraction
2
Zinc oxide
2
Absorption edges
1
Acoustic surface wave devices
1
Acoustic waves
1
Adhesion
1
Agglomeration
1
Aluminum
1
Annealing
1
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1by Abdullah M., Badar, N., Chayed, N.F, Elong, K., Kamarulzaman, N., Yahaya Subban, R.HSubjects: “...Semiconductor materials...”
Published 2020
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3by Abdillih, N.S.S.M, Abdullah M., Badar, N., Chayed, N.F, Elong, K., Kamarulzaman, N.Subjects: “...Semiconductor materials...”
Published 2020
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5Subjects: “...Field emission scanning electron microscopy...”
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7by Abdullah M., Azniwati, A.A, Faiza, M.A, Hasniraaiman, A.H, Ishak, M.A.M, Zuliahani, A.Subjects: “...Semiconductor materials...”
Published 2020
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8by Bianco, F., Blaga, C.V, Ciampalini, G., Fabbri, F., Fontcuberta I Morral, A., Pezzini, S., Roddaro, S., Taniguchi, T., Tappy, N., Watanabe, K.Subjects: “...Exfoliation (materials science)...”
Published 2022
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9Subjects: “...High resolution transmission electron microscopy...”
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10by Benetti, M., Buzzin, A., Caliendo, C., Cannatà, D., de Cesare, G., Grossi, F., Verona, E.Subjects: “...II-VI semiconductors...”
Published 2023
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