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Semiconductor materials
Scanning electron microscopy
6
Combustion method
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Field emission microscopes
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Field emission scanning electron microscopy
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Substrates
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Annealing temperatures
2
Crystallite size
2
Electronic materials
2
Field emission cathodes
2
Field emission scanning electron microscopes
2
Graphene
2
Lithium compounds
2
Morphology
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Nickel compounds
2
Polyesters
2
Semiconductor doping
2
Semiconductors
2
Silicon
2
Silicon substrates
2
Thin films
2
Titanium compounds
2
X ray diffraction
2
ATLAS device simulators
1
Absorption edges
1
Adhesion
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Adsorption process
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Aerogels
1
Agglomeration
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Aluminum
1
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1by Abdullah M., Badar, N., Chayed, N.F, Elong, K., Kamarulzaman, N., Yahaya Subban, R.HSubjects: “...Semiconductor materials...”
Published 2020
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3by Abdullah, M.A.R, Ahmad, M.K, Al Junid, S.A.M, Ismail, A.S, Malek, M.F, Mamat, M.H, Mohamed, A., Rusop, M., Shameem Banu, I.B, Suriani, A.B, Yusoff, M.M, Zoolfakar, A.SSubjects: “...Electronic materials...”
Published 2020
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5by Abdillih, N.S.S.M, Abdullah M., Badar, N., Chayed, N.F, Elong, K., Kamarulzaman, N.Subjects: “...Semiconductor materials...”
Published 2020
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6by Abd Rahim, A.F, Abdullah M., Abu Bakar, A., Hamzah, I.H, Mahmood, A., Mohd Razali, N.S, Radzali, R., Shamlan, M.Subjects: “...Semiconductor materials...”
Published 2020
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10by Abdul Rani, N.H, Abdullah M., Anaziah Muhamad, S.H, Basear, Y., Jehan Elham, O.S, Mohamad, N.F, Mohammed Faisal, M.K, Muda, S.ASubjects: “...Semiconductor materials...”
Published 2020
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11by Abdullah M., Azniwati, A.A, Faiza, M.A, Hasniraaiman, A.H, Ishak, M.A.M, Zuliahani, A.Subjects: “...Semiconductor materials...”
Published 2020
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