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1by Joh, Jungwoo“... performance, GaN high electron mobility transistors (HEMT) have still limited reliability. In RF power...”
Published 2007
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2by Joh, Jungwoo“... (p. 147-153). === The deployment of GaN high electron mobility transistors (HEMT) in RF power...”
Published 2010
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3by Warnock, Shireen M“... performance is threated by their fundamental physical limits. With silicon approaching these limits, MOSFETs...”
Published 2014
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4by Guo, Alex“... that accounts for the device dynamics and that is electron trapping/detrapping in pre-existing oxide traps...”
Published 2017
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5by Cai, Xiaowei,Ph.D.Massachusetts Institute of Technology.“...This electronic version was submitted by the student author. The certified thesis is available...”
Published 2019
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6by Zhao, Xin, Ph. D. Massachusetts Institute of Technology“... to this device concept is to engineer the density of states of electrons at the source via a superlattice. We...”
Published 2013
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