CMOS CMOS integrated circuits 3 Noise figure 2 180 nm 1 ASIC 1 Automotive industry 1 Build in self tests 1 Built-In Self-Test 1 Built-in self test 1 Builtin self tests (BIST) 1 Costs 1 Coupled-lines 1 Design flows 1 Design for testability 1 Design of experiments 1 Differential 1 Energy efficiency 1 FPGA 1 Filter 1 Filter model 1 Harmonic analysis 1 Harmonic-Canceling filter 1 Harmonic-canceling filter 1 Integrated circuit design 1 Integrated circuits 1 I–V conversion 1 K bands 1 K-band 1 Ka band 1 Ka-band 1