Modeling the Displacement Damage on Trigger Current of Anode-Short MOS-Controlled Thyristor

by Lei Li, Ze Hong Li, Yu Zhou Wu, Xiao Chi Chen, Jin Ping Zhang, Min Ren, Yuan Jian, Bo Zhang
Published 2020-01-01

Enhanced Switching Properties in TaO_x Memristors Using Diffusion Limiting Layer for Synaptic Learning

by Pei-Yu Jung, Debashis Panda, Sridhar Chandrasekaran, Sailesh Rajasekaran, Tseung-Yuen Tseng
Published 2020-01-01

Analog IGZO Memristor With Extended Capabilities

by V. Dumitru, C. Besleaga, O. N. Ionescu
Published 2020-01-01

DC and 28 GHz Reliability of a SOI FET Technology

by Edmundo A. Gutierrez-D., Jairo Mendez-V., Julio C. Tinoco, Emmanuel Torres Rios, Oscar V. Huerta-G.
Published 2020-01-01

High-Performance Amorphous Zinc–Tin–Oxide Thin-Film Transistors With Low Tin Concentration

by Shufeng Weng, Rongsheng Chen, Wei Zhong, Sunbin Deng, Guijun Li, Fion Sze Yan Yeung, Linfeng Lan, Zhijian Chen, Hoi-Sing Kwok
Published 2019-01-01

RESURF Principle in AlGaN/GaN HEMTs: Accurate 1-D Modeling on Off-State Avalanche Breakdown Behavior via Effective Concentration Profile

by Jun Zhang, Yufeng Guo
Published 2020-01-01

Traps Around Ge Schottky Junction Interface: Quantitative Characterization and Impact on the Electrical Properties of Ge MOS Devices

by Junkang Li, Zhuo Chen, Yiming Qu, Rui Zhang
Published 2020-01-01

Analysis and Modeling of Lateral Power Devices With Stepped Drift Region Thickness via Effective Concentration Profile Concept

by Jun Zhang, Yu-Feng Guo, Chen-Yang Huang, Fang-Ren Hu
Published 2020-01-01

Impact of Cycling Induced Intercell Trapped Charge on Retention Charge Loss in 3-D NAND Flash Memory

by Xinlei Jia, Lei Jin, Wei Hou, Zhiyu Wang, Songmin Jiang, Kaiwei Li, Dejia Huang, Hongtao Liu, Wenzhe Wei, Jianwei Lu, An Zhang, Zongliang Huo
Published 2020-01-01

Electrical Characteristics of LDD and LDD-Free FinFET Devices of Dimension Compatible With 14 nm Technology Node

by Yuchen Du, Md Khaled Hassan, Ri-an Zhao, Xinggong Wan, Manoj Joshi
Published 2020-01-01

Asymmetric Low Metal Contamination Ni-Induced Lateral Crystallization Polycrystalline-Silicon Thin-Film Transistors With Low OFF-State Currents for Back-End of Line (BEOL) Compatib...

by Po-Yi Kuo, Shao-Chi Lo, Hsiu-Hsuan Wei, Po-Tsun Liu
Published 2020-01-01

Computational Modelling-Based Device Design for Improved mmWave Performance and Linearity of GaN HEMTs

by Ankit Soni, Mayank Shrivastava
Published 2020-01-01

Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs

by Jongsu Oh, Kyung-Mo Jung, Eun Kyo Jung, Jungwoo Lee, Soo-Yeon Lee, Keechan Park, Jae-Hong Jeon, Yong-Sang Kim
Published 2020-01-01

Oxygen-Related Reliability of Amorphous InGaZnO Thin Film Transistors

by Chia-Chun Yen, An-Hung Tai, Yu-Chieh Liu, Tsang-Long Chen, Cheng-Hsu Chou, C. W. Liu
Published 2020-01-01

Physical Mechanisms of Reverse DIBL and NDR in FeFETs With Steep Subthreshold Swing

by Chengji Jin, Takuya Saraya, Toshiro Hiramoto, Masaharu Kobayashi
Published 2020-01-01

Operation Scheme of Multi-Layer Neural Networks Using NAND Flash Memory as High-Density Synaptic Devices

by Sung-Tae Lee, Suhwan Lim, Nag Yong Choi, Jong-Ho Bae, Dongseok Kwon, Byung-Gook Park, Jong-Ho Lee
Published 2019-01-01

Low-Voltage Hf-ZnO Thin Film Transistors With Ag Nanowires Gate Electrode and Their Application in Logic Circuit

by Jialong Wu, Jun Yang, Xuyong Yang, Xingwei Ding
Published 2020-01-01

Compact Modeling of Surface Potential, Drain Current and Terminal Charges in Negative Capacitance Nanosheet FET including Quasi-Ballistic Transport

by Amol D. Gaidhane, Girish Pahwa, Avirup Dasgupta, Amit Verma, Yogesh Singh Chauhan
Published 2020-01-01

TCAD Analysis of the Four-Terminal Poly-Si TFTs on Suppression Mechanisms of the DC and AC Hot-Carrier Degradation

by Ting Gao, Mingxiang Wang, Huaisheng Wang, Dongli Zhang
Published 2019-01-01

Foreword Special Section on Flexible Electronics From the Selected Extended Papers Presented at 2018 IFETC

by Gaozhi Xiao, Samar K. Saha, Taya Chu, Ye Tao, Arokia Nathan
Published 2019-01-01