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廖青松
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廖青松
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廖青松
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1
Effective Edge Width for 65 nm pMOSFETs and Their Variations under HC Stress at Elevated Temperature
by
Ching-Sung Liao
,
廖
青松
Published 2009
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2
Effective Edge Width for 65 nm pMOSFETs and Their Variations under HC Stress at Elevated Temperature
by
Ching-Sung Liao
,
廖
青松
Published 2009
Get full text
Others
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