Author Search Results

1

A Milling Force Model for Roughing End Mill

by Jan-Mo Lee, 李建模
Published 1996

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2

Automatic IR-Drop ECO Using Machine Learning

by Heng-Yi Lin, 林恆毅
Published 2018
Other Authors: “...李建模...”

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3

Chip Performance Prediction Using Machine Learning Techniques

by Min-Yan Su, 蘇旻彥
Published 2019
Other Authors: “...李建模...”

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4

High Efficiency and Low Overkill Testing for Probabilistic Circuits

by Ming-Ting Lee, 李明庭
Published 2019
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5

Test Pattern Compression for Probabilistic Circuit

by Chih-Ming Chang, 張志銘
Published 2017
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6

Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits

by Chun-Yi Kuo, 郭俊儀
Published 2012
Other Authors: “...李建模...”

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7

IEEE 1500 Compatible Test Wrapper Design and Validation for At-Speed Delay Testing

by Tsung-Ping Kao, 高琮評
Published 2007
Other Authors: “...李建模...”

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8

Physical-aware and Timing-aware Diagnosis for Systematic Defects and Small Delay Defects in Advanced Technology

by Po-Juei Chen, 陳柏瑞
Published 2014
Other Authors: “...李建模...”

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9

Lithography-aware Bridging Fault Diagnosis to Identify the Layer of Systematic Defects

by Wei-Li Hsu, 徐偉力
Published 2011
Other Authors: “...李建模...”

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10

Test Pattern Modification for Average IR-drop Reduction

by Wei-Sheng Ding, 丁瑋陞
Published 2013
Other Authors: “...李建模...”

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11

Multiple Defect Physical-aware Diagnosis

by Chieh-Chih Che, 車介智
Published 2013
Other Authors: “...李建模...”

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12

Yield Optimization of Flexible TFT Analog Circuits

by Wen-En Wei, 魏文恩
Published 2012
Other Authors: “...李建模...”

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13

DR-scan: A Test Methodology for Dual-rail Asynchronous Circuits

by Shih-An Hsieh, 謝詩安
Published 2014
Other Authors: “...李建模...”

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