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Abdul Wahab, Y.
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Abdul Wahab, Y.
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Abdul Wahab, Y.
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1
Effects of gate stack structural and process defectivity on high- k dielectric dependence of nbti reliability in 32 nm technology node PMOSFETs
by
Abdul
Wahab
,
Y
.
,
Bukhori, M.F
,
Hussin, H.
,
Soin, N.
,
Wan Muhamad Hatta, S.
Published 2014
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2
Radiation Pattern Reconfigurable FM Antenna
by
Abd Rahim, H.
,
Abdul
Wahab
,
Y
.
,
Al-Bawri, S.
,
Ali, T.
,
Bharath Gopalakrishnan, J.
,
Dharma R.
,
Hafizudin Mat, M.
,
Hendrik B.
,
Jusoh, M.
,
Majid, H.A
,
Muhammad A.
,
Nasrun Osman, M.
,
Rahim R.
,
Sabapathy, T.
,
Yaasin, M.N
Published 2019
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Related Subjects
Antenna grounds
Article
Directional patterns (antenna)
FM antennas
Frequency modulation
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Manufacturing cost
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degradation
density
dipole
electric field
electric potential
electrical parameters
field effect transistor
geometry
hafnium
hydrodynamics
mathematical model
negative bias temperature instability
relaxation time
reliability
silicon dioxide
temperature stress
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